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%0 Conference Paper
%1 sharma2022characterization
%A Sharma, Kanuj
%A Kamm, Simon
%A Munoz Baron, Kevin
%A Kallfass, Ingmar
%B 2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)
%D 2022
%I IEEE
%K
%T Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network
%@ 978-90-75815-39-9 and 978-1-66548-700-9
@inproceedings{sharma2022characterization,
adddress = {Piscataway, NJ},
added-at = {2023-09-26T15:43:55.000+0200},
affiliation = {Sharma, K (Corresponding Author), Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany.
Sharma, Kanuj; Baron, Kevin Munoz; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany.
Kamm, Simon, Univ Stuttgart, Inst Automat & Software Syst, Stuttgart, Germany.},
author = {Sharma, Kanuj and Kamm, Simon and Munoz Baron, Kevin and Kallfass, Ingmar},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2988b11c59c1e74831fff4e6f36e754a8/unibiblio},
booktitle = {2022 24th European Conference on Power Electronics and Applications (EPE'22 ECCE Europe)},
eventdate = {2022-09-05/2022-09-09},
eventtitle = {24th European Conference on Power Electronics and Applications (EPE ECCE Europe)},
interhash = {966dc1bd97b3f4a53f656638c23cf2c1},
intrahash = {988b11c59c1e74831fff4e6f36e754a8},
isbn = {{978-90-75815-39-9} and {978-1-66548-700-9}},
keywords = {},
language = {eng},
publisher = {IEEE},
series = {European Conference on Power Electronics and Applications},
timestamp = {2023-09-26T13:43:55.000+0200},
title = {Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network},
unique-id = {WOS:000886231604004},
venue = {Hannover},
year = 2022
}