%0 Conference Paper %1 conf/ets/CzutroHEPCRB08 %A Czutro, Alejandro %A Houarche, Nicolas %A Engelke, Piet %A Polian, Ilia %A Comte, Mariane %A Renovell, Michel %A Becker, Bernd %B European Test Symposium %D 2008 %I IEEE Computer Society %K dblp %P 113-118 %T A Simulator of Small-Delay Faults Caused by Resistive-Open Defects. %U http://dblp.uni-trier.de/db/conf/ets/ets2008.html#CzutroHEPCRB08 %@ 978-0-7695-3150-2

@inproceedings{conf/ets/CzutroHEPCRB08, added-at = {2015-08-18T00:00:00.000+0200}, author = {Czutro, Alejandro and Houarche, Nicolas and Engelke, Piet and Polian, Ilia and Comte, Mariane and Renovell, Michel and Becker, Bernd}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/226228f0fecd3130ae469e566a439e4a7/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2008}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.19}, interhash = {29a0e63665ba2c1c8b6e6b30ee61a0a1}, intrahash = {26228f0fecd3130ae469e566a439e4a7}, isbn = {978-0-7695-3150-2}, keywords = {dblp}, pages = {113-118}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:08.000+0100}, title = {A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2008.html#CzutroHEPCRB08}, year = 2008 }