Today, we publish two papers on Open Access (OA), a first one on successful OA implementation and a second one on OA for conference proceedings in engineering disciplines. On top of that, our association endorses the Action Plan for Diamond Open Access.
TextRelease is an initiative headed by Dr. Dominic J. Farace recognized for his accomplishments in the field of grey literature. Grey Literature is produced and distributed on all levels of government, academics, business and industry in print and electronic formats not controlled by commercial publishers i.e. where publishing is not the primary activity of the publishing body.
P. Somers, J. Schüle, C. Tarín, and O. Sawodny. 2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), page 4222-4225. (November 2021)
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
U. Afzal, C. Merten, and M. Aleysa. 22.11 - 23.11.2017, Babol, Iran, (2017)ICHMT2017, 22.11 - 23.11.2017, Babol Noshirvani University of Technology, Babol, Iran.
W. Osten, G. Pedrini, P. Weidmann, and R. Gadow. SPECKLE 2015: VI International Conference on Speckle Metrology, 9660, page 96600H. International Society for Optics and Photonics, SPIE, (2015)
F. Beck, M. Hirschler, U. Nieken, and P. Eberhard. 2014, Erlangen, Germany, (2014)Proceedings of the 85th Annual Meeting of the International Association of Applied Mathematics and Mechanics, 2014, Erlangen, Germany.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, F. Schaal, and .... AIP Conference …, (2010)10 cites: https://scholar.google.com/scholar?cites=9989101753206569078&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, and .... Proc. SPIE, (2014)4 cites: https://scholar.google.com/scholar?cites=15964016983552008003&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, C. Pruss, and W. Osten. Holography, Diffractive Optics, and Applications VI, 9271, page 927105. International Society for Optics and Photonics, SPIE, (2014)
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, M. Aissa, and .... … Systems for Industrial …, (2011)14 cites: https://scholar.google.com/scholar?cites=8158545852653943976&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.
D. Buchta, N. Hein, G. Pedrini, C. Krekel, and W. Osten. Optics for Arts, Architecture, and Archaeology V, 9527, page 95270Q. International Society for Optics and Photonics, SPIE, (2015)
C. Walter, M. Hopp-Hirschler, and U. Nieken. International Center for Numerical Methods in Engineering (CIMNE), Proceedings of the 5th International Conference on Particle-Based Methods (Particles 2017), International Center for Numerical Methods in Engineering (CIMNE), (2017)
A. Birk, K. Frenner, and W. Osten. Fifteenth International Conference on Machine Vision (ICMV 2022), 12701, page 1270109. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)
S. Reichelt, and G. Pedrini. Proceedings of the 2023 6th International Conference on Machine Vision and Applications, page 72–80. New York, NY, USA, Association for Computing Machinery, (Jun 9, 2023)
W. Säckel, M. Huber, M. Hirschler, P. Kunz, and U. Nieken. 03.06.-05.06.2014, Paris, France, (2014)Proceedings of the 9th SPHERIC International Workshop, 03.06.-05.06.2014, Paris, France.
F. Schaal, M. Warber, C. Rembe, T. Haist, and W. Osten. Fringe 2009, (2009)8 cites: https://scholar.google.com/scholar?cites=14883763856837803297&as_sdt=2005&sciodt=0,5&hl=en.
S. Ludwig, G. Pedrini, X. Peng, and W. Osten. Optical Measurement Systems for Industrial Inspection XII, 11782, page 1178214. International Society for Optics and Photonics, SPIE, (2021)
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
J. Drozella, A. Toulouse, S. Thiele, and A. Herkommer. Novel Optical Systems, Methods, and Applications XXII, 11105, page 1110506. International Society for Optics and Photonics, SPIE, (2019)
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
P. Somers, J. Schüle, C. Veil, O. Sawodny, and C. Tarín. 2022 44th Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), page 609-612. (July 2022)
C. Veil, R. Bach, P. Somers, O. Sawodny, and C. Tarín. 2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC), page 6800-6805. (November 2021)
A. Faridian, G. Pedrini, and W. Osten. Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXI, 8949, page 89490H. International Society for Optics and Photonics, SPIE, (2014)
S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt. Optics and Photonics for Advanced Dimensional Metrology II, 12137, page 1213702. International Society for Optics and Photonics, SPIE, (2022)
W. Osten, T. Haist, and E. Manske. Ultra-High-Definition Imaging …, (2018)4 cites: https://scholar.google.com/scholar?cites=15533727869778562690&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, T. Dietrich, and W. Osten. Unconventional Imaging and Wavefront Sensing 2014, 9227, page 922702. International Society for Optics and Photonics, SPIE, (2014)
T. Haist, A. Steinitz, and F. Guerra. Optics and Photonics for Advanced Dimensional Metrology, 11352, page 1135204. International Society for Optics and Photonics, SPIE, (2020)
J. Schindler, C. Pruss, and W. Osten. Optical Measurement Systems for Industrial Inspection X, 10329, page 1032904. International Society for Optics and Photonics, SPIE, (2017)
S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
B. Chen, S. Thiele, M. Xu, and A. Herkommer. Optical Design and Engineering VII, 10690, page 1069016. International Society for Optics and Photonics, SPIE, (2018)
A. Bielke, G. Baer, C. Pruss, and W. Osten. 2015 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 9618, page 961807. International Society for Optics and Photonics, SPIE, (2015)