T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, and .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and .... Forum Bildverarbeitung …, (2016)2 cites: https://scholar.google.com/scholar?cites=8919893009457312879&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
L. Seifert, T. Ruppel, T. Haist, and .... Interferometry XIII …, (2006)2 cites: https://scholar.google.com/scholar?cites=7147880278335580806&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Comput. Sci. Eng., (2006)3 cites: https://scholar.google.com/scholar?cites=14566195398217273875&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1999)6 cites: https://scholar.google.com/scholar?cites=7686503495750243020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, T. Haist, M. Warber, and S. Osten. Proceedings of SPIE, (2007)3 cites: https://scholar.google.com/scholar?cites=17443734874373782994&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI Berichte, (1981)3 cites: https://scholar.google.com/scholar?cites=6001163947811595426&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optical Inspection and …, (1997)3 cites: https://scholar.google.com/scholar?cites=4086429519103832408&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, and .... … Measurement Systems for …, (2007)3 cites: https://scholar.google.com/scholar?cites=13122883090839124938&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, W. Osten, M. Reicherter, and .... Optical Information …, (2003)3 cites: https://scholar.google.com/scholar?cites=13914692911788684678&as_sdt=2005&sciodt=0,5&hl=en.
D. Fleischle, W. Lyda, T. Haist, and W. Osten. DGaO Proceedings, (2009)4 cites: https://scholar.google.com/scholar?cites=16419362578584721445&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2009)5 cites: https://scholar.google.com/scholar?cites=15570446517660484183&as_sdt=2005&sciodt=0,5&hl=en.
C. Rembe, and T. Haist. US Patent 8,115,933, (2012)5 cites: https://scholar.google.com/scholar?cites=13085958234674355483&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Optical Micro-and Nanometrology …, (2012)5 cites: https://scholar.google.com/scholar?cites=8284401030473063862&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, T. Haist, M. Hasler, and W. Osten. Optical Engineering, (2012)5 cites: https://scholar.google.com/scholar?cites=11260130449230490731&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, and .... Proc. SPIE, (2014)4 cites: https://scholar.google.com/scholar?cites=15964016983552008003&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. Journal of Micro/Nanolithography, MEMS …, (2015)7 cites: https://scholar.google.com/scholar?cites=16007974591760507561&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, J. Stahl, T. Haist, and W. Osten. Optical Engineering, (2015)4 cites: https://scholar.google.com/scholar?cites=2954937903817151273&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and E. Manske. Ultra-High-Definition Imaging …, (2018)4 cites: https://scholar.google.com/scholar?cites=15533727869778562690&as_sdt=2005&sciodt=0,5&hl=en.
E. Wagemann, T. Haist, and H. Tiziani. Optics communications, (1998)6 cites: https://scholar.google.com/scholar?cites=18152547233854539301&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and K. Korner. Proceedings of International Conference On Laser …, (2003)9 cites: https://scholar.google.com/scholar?cites=1836599854242513742&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and .... Laser Metrology and …, (1999)9 cites: https://scholar.google.com/scholar?cites=3277523645490623696&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2008)10 cites: https://scholar.google.com/scholar?cites=17386422767713101032&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, F. Schaal, and .... AIP Conference …, (2010)10 cites: https://scholar.google.com/scholar?cites=9989101753206569078&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and W. Osten. Optical Engineering, (2011)9 cites: https://scholar.google.com/scholar?cites=16941387280344346587&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, M. Hasler, T. Haist, and .... European Conference on …, (2011)9 cites: https://scholar.google.com/scholar?cites=14528589801084573186&as_sdt=2005&sciodt=0,5&hl=en.
M. Reicherter, T. Haist, S. Zwick, A. Burla, and .... Optical Trapping …, (2005)11 cites: https://scholar.google.com/scholar?cites=5362886375644632840&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, D. Fleischle, T. Haist, and .... Optical Inspection and …, (2009)11 cites: https://scholar.google.com/scholar?cites=16198342556063896427&as_sdt=2005&sciodt=0,5&hl=en.
C. Kohler, T. Haist, and W. Osten. Optical Engineering, (2009)13 cites: https://scholar.google.com/scholar?cites=5258858583107486043&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, C. Schaub, T. Haist, and W. Osten. Optics Express, (2010)11 cites: https://scholar.google.com/scholar?cites=14873270305070020601&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and .... Proc. SPIE, (2010)13 cites: https://scholar.google.com/scholar?cites=11729316344759848032&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, S. Maier, T. Haist, and W. Osten. Applied optics, (2010)13 cites: https://scholar.google.com/scholar?cites=17105723800624126736&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, M. Gronle, and W. Osten. International Journal of …, (2012)12 cites: https://scholar.google.com/scholar?cites=9954681190140723856&as_sdt=2005&sciodt=0,5&hl=en.
E. Wagemann, T. Haist, M. Schönleber, and H. Tiziani. Optics communications, (1999)15 cites: https://scholar.google.com/scholar?cites=3306664058810748006&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, T. Haist, J. Liesener, and .... Spatial Light …, (2001)15 cites: https://scholar.google.com/scholar?cites=13453178495817267113&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and H. Tiziani. Journal of Optics A: Pure …, (1999)15 cites: https://scholar.google.com/scholar?cites=8162882387938461535&as_sdt=2005&sciodt=0,5&hl=en.
…, M. Warber, S. Zwick, H. van der Kuip, T. Haist, and .... Journal of the European Optical Society, (2009)15 cites: https://scholar.google.com/scholar?cites=3295751589320055504&as_sdt=2005&sciodt=0,5&hl=en.
W. Lyda, A. Burla, T. Haist, J. Zimmermann, and .... Optical Micro-and …, (2010)14 cites: https://scholar.google.com/scholar?cites=1524075053293164982&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, M. Aissa, and .... … Systems for Industrial …, (2011)14 cites: https://scholar.google.com/scholar?cites=8158545852653943976&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, and W. Osten. Optical Engineering, (2012)13 cites: https://scholar.google.com/scholar?cites=1065791505102195850&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, and W. Osten. Applied optics, (2012)16 cites: https://scholar.google.com/scholar?cites=7007654108719796123&as_sdt=2005&sciodt=0,5&hl=en.