Author of the publication

Transient fault characterization in dynamic noisy environments.

, , , and . ITC, page 10. IEEE Computer Society, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Parallel SAT Solving in Bounded Model Checking., , , , and . J. Log. Comput., 21 (1): 5-21 (2011)Fault Models and Test Algorithms for Nanoscale Technologies (Fehlermodelle und Testalgorithmen für Nanoscale-Technologien)., and . it - Information Technology, 52 (4): 189-194 (2010)Binary Decision Diagrams - Theory and Implementation., and . Springer, (1998)Proving QBF-hardness in Bounded Model Checking for Incomplete Designs., , and . MTV, page 23-28. IEEE Computer Society, (2013)Bounded Model Checking of Incomplete Networks of Timed Automata., , , and . MTV, page 61-66. IEEE Computer Society, (2010)On the quality of test vectors for post-silicon characterization., , , and . European Test Symposium, page 1-6. IEEE Computer Society, (2012)Selective Hardening in Early Design Steps., , , and . European Test Symposium, page 185-190. IEEE Computer Society, (2008)Improving RO-PUF quality on FPGAs by incorporating design-dependent frequency biases., , , and . ETS, page 1-6. IEEE, (2015)Improving test pattern generation in presence of unknown values beyond restricted symbolic logic., , and . ETS, page 1-6. IEEE, (2015)Automatic test pattern generation for resistive bridging faults., , , and . European Test Symposium, page 160-165. IEEE Computer Society, (2004)