%0 Conference Paper %1 conf/ets/SauerCBP12 %A Sauer, Matthias %A Czutro, Alexander %A Becker, Bernd %A Polian, Ilia %B European Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 1-6 %T On the quality of test vectors for post-silicon characterization. %U http://dblp.uni-trier.de/db/conf/ets/ets2012.html#SauerCBP12 %@ 978-1-4673-0697-3

@inproceedings{conf/ets/SauerCBP12, added-at = {2012-07-10T00:00:00.000+0200}, author = {Sauer, Matthias and Czutro, Alexander and Becker, Bernd and Polian, Ilia}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b6c3562097c715e5973f9bc8754e9d14/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2012}, ee = {http://dx.doi.org/10.1109/ETS.2012.6233027}, interhash = {e8b55aade7da165d08d8c99d65334314}, intrahash = {b6c3562097c715e5973f9bc8754e9d14}, isbn = {978-1-4673-0697-3}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:06.000+0100}, title = {On the quality of test vectors for post-silicon characterization.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2012.html#SauerCBP12}, year = 2012 }