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Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors.

, , , , and . IEEE Trans. Industrial Electronics, 65 (3): 2518-2524 (2018)

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Modelling of a charge control method for capacitive MEMS., , , , , and . ECCTD, page 1-4. IEEE, (2013)Second order sigma-delta control of charge trapping for MOS capacitors., , , and . Microelectronics Reliability, (2017)Control of MEMS Vibration Modes With Pulsed Digital Oscillators - Part II: Simulation and Experimental Results., , , , , , , , and . IEEE Trans. on Circuits and Systems, 57-I (8): 1879-1890 (2010)Sigma - Delta inspired control technique for the improvement of MEMS reliability., , , , , and . ISCAS, page 1243-1246. IEEE, (2014)Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors., , , , and . IEEE Trans. Industrial Electronics, 65 (3): 2518-2524 (2018)Understanding complexity in multiphysics systems-on-a-chip: Modern approaches for design., , , , , , , and . ISCAS, page 1546-1549. IEEE, (2015)Charge Trapping Control in MOS Capacitors., , , , , , and . IEEE Trans. Industrial Electronics, 64 (4): 3023-3029 (2017)Sliding-Mode Analysis of the Dynamics of Sigma-Delta Controls of Dielectric Charging., , and . IEEE Trans. Industrial Electronics, 63 (4): 2320-2329 (2016)Analysis of the Σ-Δ pulsed digital oscillator for MEMS., , , , , and . IEEE Trans. on Circuits and Systems, 52-I (11): 2286-2297 (2005)General Dynamics of Pulsed Digital Oscillators., , and . IEEE Trans. on Circuits and Systems, 55-I (7): 2038-2050 (2008)