%0 Journal Article %1 journals/tie/PumarBGLP18 %A Pumar, Manuel Domínguez %A Bheesayagari, Chenna Reddy %A Gorreta, Sergi %A Lopez-Rodriguez, Gema %A Pons-Nin, Joan %D 2018 %J IEEE Trans. Industrial Electronics %K dblp %N 3 %P 2518-2524 %T Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors. %U http://dblp.uni-trier.de/db/journals/tie/tie65.html#PumarBGLP18 %V 65

@article{journals/tie/PumarBGLP18, added-at = {2018-11-24T00:00:00.000+0100}, author = {Pumar, Manuel Domínguez and Bheesayagari, Chenna Reddy and Gorreta, Sergi and Lopez-Rodriguez, Gema and Pons-Nin, Joan}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25f70ae7d6cf83a1ee168d80c296d1692/dblp}, ee = {https://www.wikidata.org/entity/Q58468424}, interhash = {e404711c852c3232d8aeae7ea7dc6670}, intrahash = {5f70ae7d6cf83a1ee168d80c296d1692}, journal = {IEEE Trans. Industrial Electronics}, keywords = {dblp}, number = 3, pages = {2518-2524}, timestamp = {2019-09-27T06:07:41.000+0200}, title = {Closed-Loop Compensation of Charge Trapping Induced by Ionizing Radiation in MOS Capacitors.}, url = {http://dblp.uni-trier.de/db/journals/tie/tie65.html#PumarBGLP18}, volume = 65, year = 2018 }