Author of the publication
Please choose a person to relate this publication to
To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.
Other publications of authors with the same name
Self-Learning Tuning for Post-Silicon Validation (2022)Feature Selection Using Batch-Wise Attenuation and Feature Mask NormalizationIJCNN 2021, virtual event, 18-22 July 2021 - the International Joint Conference on Neural Networks, New York, NY, IEEE, (2021)Learn to Tune: Robust Performance Tuning in Post-Silicon Validation2023 IEEE European Test Symposium (ETS), page 1-4. (May 2023)Interactive Analysis of Post-Silicon Validation Data2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing, page 8-14. Piscataway, NJ, IEEE, (2022)Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information2022 IEEE International Test Conference (ITC), page 1-9. Piscataway, IEEE, (2022)ORSA : Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), page 1357-1364. Piscataway, IEEE, (2021)Intelligent Methods for Test and Reliability2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)Intelligent Methods for Test and Reliability2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 969-974. Piscataway, IEEE, (2022)