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%0 Conference Paper
%1 liao2022wafer
%A Liao, Yiwen
%A Latty, Raphaël
%A Genßler, Paul R.
%A Amrouch, Hussam
%A Yang, Bin
%B 2022 IEEE International Test Conference (ITC)
%C Piscataway
%D 2022
%I IEEE
%K
%P 1-9
%R 10.1109/ITC50671.2022.00006
%T Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information
%@ 978-1-6654-6270-9 and 978-1-6654-6271-6
@inproceedings{liao2022wafer,
added-at = {2023-09-19T16:08:04.000+0200},
address = {Piscataway},
affiliation = {Liao, YW (Corresponding Author), Univ Stuttgart, Inst Signal Proc & Syst Theory, Stuttgart, Germany.
Liao, Yiwen; Yang, Bin, Univ Stuttgart, Inst Signal Proc & Syst Theory, Stuttgart, Germany.
Genssler, Paul R.; Amrouch, Hussam, Univ Stuttgart, Inst Comp Architecture & Comp Engn, Stuttgart, Germany.
Latty, Raphael, Advantest Europe GmbH, Appl Res & Venture Team, Boblingen, Germany.},
author = {Liao, Yiwen and Latty, Raphaël and Genßler, Paul R. and Amrouch, Hussam and Yang, Bin},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e07f3d0042d9a2f0dd4f3db56c2a543b/unibiblio},
booktitle = {2022 IEEE International Test Conference (ITC)},
doi = {10.1109/ITC50671.2022.00006},
eventdate = {2022-09-23/2022-09-30},
eventtitle = {2022 IEEE International Test Conference (ITC)},
interhash = {dee4717db73c057259f1ed60d654d33e},
intrahash = {e07f3d0042d9a2f0dd4f3db56c2a543b},
isbn = {{978-1-6654-6270-9} and {978-1-6654-6271-6}},
keywords = {},
language = {eng},
pages = {1-9},
publisher = {IEEE},
research-areas = {Computer Science; Engineering},
timestamp = {2023-09-19T14:08:04.000+0200},
title = {Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information},
unique-id = {WOS:000918580100001},
venue = {Anaheim, USA},
year = 2022
}