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Interactive Analysis of Post-Silicon Validation Data

A. Lalama, J. Knittel, S. Koch, D. Weiskopf, T. Ertl, S. Rottacker, R. Latty, and J. Rivoir. 2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing, page 8-14. Piscataway, NJ, IEEE, (2022)
DOI: 10.1109/TestVis57757.2022.00007

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Dr. Jochen Seidel University of Stuttgart

Hon. -Prof. Dr. Jochen Mannhart University of Stuttgart

Jochen Wiedemann University of Stuttgart

Jochen Fähndrich University of Stuttgart

Hon. -Prof. Dr. -Ing. Carl-Jochen Winter University of Stuttgart

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