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Interactive Analysis of Post-Silicon Validation Data

, , , , , , , and . 2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing, page 8-14. Piscataway, NJ, IEEE, (2022)
DOI: 10.1109/TestVis57757.2022.00007

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Self-Learning Tuning for Post-Silicon Validation, , , and . (2022)Feature Selection Using Batch-Wise Attenuation and Feature Mask Normalization, , and . IJCNN 2021, virtual event, 18-22 July 2021 - the International Joint Conference on Neural Networks, New York, NY, IEEE, (2021)Wafer Map Defect Classification Based on the Fusion of Pattern and Pixel Information, , , , and . 2022 IEEE International Test Conference (ITC), page 1-9. Piscataway, IEEE, (2022)ORSA : Outlier Robust Stacked Aggregation for Best- and Worst-Case Approximations of Ensemble Systems, , , and . 2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA), page 1357-1364. Piscataway, IEEE, (2021)Interactive Analysis of Post-Silicon Validation Data, , , , , , , and . 2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing, page 8-14. Piscataway, NJ, IEEE, (2022)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 969-974. Piscataway, IEEE, (2022)Learn to Tune : Robust Performance Tuning in Post-Silicon Validation, , and . 2023 IEEE European Test Symposium (ETS), IEEE, (2023)