Author of the publication

Cross-Layer Modeling and Simulation of Circuit Reliability.

, , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (1): 8-23 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Sutaria, Ketul
add a person with the name Sutaria, Ketul
 

Other publications of authors with the same name

Where is the Achilles Heel under Circuit Aging., , , and . ISVLSI, page 278-279. IEEE Computer Society, (2014)Compact modeling of STT-MTJ for SPICE simulation., , , , and . ESSDERC, page 338-341. IEEE, (2013)Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques., , , , and . SiPS, page 125-130. IEEE, (2012)Hierarchical modeling of Phase Change memory for reliable design., , , , and . ICCD, page 115-120. IEEE Computer Society, (2012)BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation., , , , , and . DAC, page 203:1-203:6. ACM, (2014)Physics matters: statistical aging prediction under trapping/detrapping., , , and . DAC, page 139-144. ACM, (2012)Statistical aging under dynamic voltage scaling: A logarithmic model approach., , , , , and . CICC, page 1-4. IEEE, (2012)Cross-Layer Modeling and Simulation of Circuit Reliability., , , , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 33 (1): 8-23 (2014)RTN in Scaled Transistors for On-Chip Random Seed Generation., , , , and . IEEE Trans. VLSI Syst., 25 (8): 2248-2257 (2017)Duty cycle shift under static/dynamic aging in 28nm HK-MG technology., , , , , , and . IRPS, page 7. IEEE, (2015)