%0 Journal Article %1 journals/tcad/CaoVSCAEBF14 %A Cao, Yu %A Velamala, Jyothi %A Sutaria, Ketul %A Chen, Mike Shuo-Wei %A Ahlbin, Jonathan %A Esqueda, Ivan Sanchez %A Bajura, Michael %A Fritze, Michael %D 2014 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 1 %P 8-23 %T Cross-Layer Modeling and Simulation of Circuit Reliability. %U http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#CaoVSCAEBF14 %V 33

@article{journals/tcad/CaoVSCAEBF14, added-at = {2014-02-10T00:00:00.000+0100}, author = {Cao, Yu and Velamala, Jyothi and Sutaria, Ketul and Chen, Mike Shuo-Wei and Ahlbin, Jonathan and Esqueda, Ivan Sanchez and Bajura, Michael and Fritze, Michael}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21d5462f9b511812364e9274b685170b9/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2013.2289874}, interhash = {d8a8bef9bd417e919364194267ac25d9}, intrahash = {1d5462f9b511812364e9274b685170b9}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 1, pages = {8-23}, timestamp = {2016-02-02T10:08:23.000+0100}, title = {Cross-Layer Modeling and Simulation of Circuit Reliability.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad33.html#CaoVSCAEBF14}, volume = 33, year = 2014 }