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Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning., , and . Microelectronics Reliability, 51 (9-11): 1632-1636 (2011)Security Risks Posed by Modern IC Debug and Diagnosis Tools., , and . FDTC, page 3-11. IEEE Computer Society, (2013)Cloning Physically Unclonable Functions., , , and . HOST, page 1-6. IEEE Computer Society, (2013)A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family., , , , , , , , and . IACR Cryptology ePrint Archive, (2015)IC security and quality improvement by protection of chip backside against hardware attacks., , , , , , and . Microelectronics Reliability, (2018)Photon emission as a characterization tool for bipolar parasitics in FinFET technology., , , , , and . Microelectronics Reliability, (2018)Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing., , , , , and . Microelectronics Reliability, 49 (9-11): 1158-1164 (2009)On charge sensors for FIB attack detection., , and . HOST, page 128-133. IEEE Computer Society, (2012)Nano Security : From Nano-Electronics to Secure Systems, , , , , , , , , and 13 other author(s). 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 1334-1339. Piscataway, IEEE, (2021)Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits., , and . Microelectronics Reliability, 48 (8-9): 1295-1299 (2008)