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Disambiguation of "Kerst, Uwe"

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On charge sensors for FIB attack detection.

, , and . HOST, page 128-133. IEEE Computer Society, (2012)

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Dr. Uwe Gaisbauer University of Stuttgart

Hon. -Prof. Dr. Uwe Pfenning University of Stuttgart

Prof. Uni. Reg. de Blumenau Uwe Menzel University of Stuttgart

Dr. rer. nat. Uwe Breitenbücher University of Stuttgart

Uwe Fischer University of Stuttgart

 

Other publications of authors with the same name

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology., , , , , , and . Microelectronics Reliability, 48 (8-9): 1322-1326 (2008)Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy., , , , , and . Microelectronics Reliability, 47 (9-11): 1523-1528 (2007)Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node., , , and . Microelectronics Reliability, 46 (9-11): 1498-1503 (2006)Extraction of local thin-film solar cell parameters by bias-dependent IR-LBIC., , and . Microelectronics Reliability, 50 (9-11): 1899-1902 (2010)Physical Techniques for Chip-Backside IC Debug in Nanotechnologies., , , and . IEEE Design & Test of Computers, 25 (3): 250-257 (2008)Backside E-Beam Probing on Nano scale devices., , , , , , , , and . ITC, page 1-9. IEEE Computer Society, (2007)Security Risks Posed by Modern IC Debug and Diagnosis Tools., , and . FDTC, page 3-11. IEEE Computer Society, (2013)Impact of back side circuit edit on active device performance in bulk silicon ICs., , , , , and . ITC, page 9. IEEE Computer Society, (2005)Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing., , , , , and . Microelectronics Reliability, 49 (9-11): 1158-1164 (2009)On charge sensors for FIB attack detection., , and . HOST, page 128-133. IEEE Computer Society, (2012)