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Improving the Resolution of Single-Delay-Fault Diagnosis., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 27 (5): 932-945 (2008)Timing-Aware Multiple-Delay-Fault Diagnosis., , , and . ISQED, page 246-253. IEEE Computer Society, (2008)Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology., , , and . ITC, page 1-10. IEEE Computer Society, (2006)A Fault-Independent Transitive Closure Algorithm for Redundancy Identification., , , and . VLSI Design, page 149-154. IEEE Computer Society, (2003)Delay Fault Diagnosis for Non-Robust Test., , , , and . ISQED, page 463-472. IEEE Computer Society, (2006)Timing-Aware Multiple-Delay-Fault Diagnosis., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 28 (2): 245-258 (2009)