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Disambiguation of "Tsai, Kun-Han"

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Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology.

, , , and . ITC, page 1-10. IEEE Computer Society, (2006)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Liao Han University of Stuttgart

Qi Han

apl. Prof. Dr. -Ing. Niels Hansen University of Stuttgart

Probing Self-Diffusion of Guest Molecules in a Covalent Organic Framework: Simulation and Experiment, , , , , , , , and . ACS Nano, 18 (25): 16091–16100 (June 2024)

Verena Kunberger University of Stuttgart

Koushani Kundu University of Stuttgart

 

Other publications of authors with the same name

Improved weight assignment for logic switching activity during at-speed test pattern generation., , , , , and . ASP-DAC, page 493-498. IEEE, (2010)Star test: the theory and its applications., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 19 (9): 1052-1064 (2000)A test-application-count based learning technique for test time reduction., , , and . VLSI-DAT, page 1-4. IEEE, (2015)Clock-domain-aware test for improving pattern compression., and . VLSI-DAT, page 1-4. IEEE, (2015)Design rule check on the clock gating logic for testability and beyond., and . ITC, page 1-8. IEEE Computer Society, (2013)Monitoring the delay of long interconnects via distributed TDC., , , and . ITC, page 1-9. IEEE, (2015)Scan-Encoded Test Pattern Generation for BIST., , and . ITC, page 548-556. IEEE Computer Society, (1997)An Efficient and Effective Methodology on the Multiple Fault Diagnosis., , , and . ITC, page 329-338. IEEE Computer Society, (2003)Programmable Leakage Test and Binning for TSVs., , , and . Asian Test Symposium, page 43-48. IEEE Computer Society, (2012)On-Line Transition-Time Monitoring for Die-to-Die Interconnects in 3D ICs., , , , and . ATS, page 162-167. IEEE Computer Society, (2014)