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A cross-layer analysis of Soft Error, aging and process variation in Near Threshold Computing., , , , and . DATE, page 205-210. IEEE, (2016)A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM., , and . IEEE Trans. VLSI Syst., 27 (7): 1697-1710 (2019)Spintronic normally-off heterogeneous system-on-chip design., , and . DATE, page 113-118. IEEE, (2018)Inkjet-Printed True Random Number Generator based on Additive Resistor Tuning., , , and . DATE, page 1361-1366. IEEE, (2019)Read disturb fault detection in STT-MRAM., , , and . ITC, page 1-7. IEEE Computer Society, (2014)Fault Tolerant Non-Volatile spintronic flip-flop., , and . DATE, page 261-264. IEEE, (2016)GREAT: HeteroGeneous IntegRated Magnetic tEchnology Using Multifunctional Standardized sTack., , , , , , , , , and 6 other author(s). ISVLSI, page 344-349. IEEE Computer Society, (2017)Predictive Modeling and Design Automation of Inorganic Printed Electronics., , , , , and . DATE, page 30-35. IEEE, (2019)Using multifunctional standardized stack as universal spintronic technology for IoT., , , , , , , , , and 8 other author(s). DATE, page 931-936. IEEE, (2018)A cross-layer adaptive approach for performance and power optimization in STT-MRAM., , , and . DATE, page 791-796. IEEE, (2018)