Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip.

M. Dimopoulos, Y. Gang, L. Anghel, M. Benabdenbi, N. Zergainoh, and M. Nicolaidis. Microprocessors and Microsystems - Embedded Hardware Design, 38 (6): 620-635 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

G. Daiß

G. Wagner

Dr. Guido Reina University of Stuttgart

Michael Böhm

Michael Funk

Other publications of authors with the same name

Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits.M. Dimopoulos, A. Spyronasios, and A. Hatzopoulos. IOLTS, page 83-87. IEEE Computer Society, (2010)Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques.M. Dimopoulos, and P. Linardis. DATE, page 194-201. IEEE Computer Society, (2004)A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI.Y. Bontzios, M. Dimopoulos, and A. Hatzopoulos. IEEE Trans. Instrumentation and Measurement, 60 (9): 3173-3184 (2011)Advanced double-sampling architectures.M. Nicolaidis, and M. Dimopoulos. IOLTS, page 130-132. IEEE, (2016)Accelerating the compaction of test sequences in sequential circuits through problem size reduction.M. Dimopoulos, and P. Linardis. IEEE Trans. on CAD of Integrated Circuits and Systems, 22 (10): 1443-1449 (2003)Circuit Implementation of a Supply Current Spectrum Test Method.M. Dimopoulos, A. Spyronasios, D. Papakostas, D. Konstantinou, and A. Hatzopoulos. IEEE Trans. Instrumentation and Measurement, 59 (10): 2660-2670 (2010)Prospects of 3D inductors on through silicon vias processes for 3D ICs.Y. Bontzios, M. Dimopoulos, and A. Hatzopoulos. VLSI-SoC, page 90-93. IEEE, (2011)Power supply current testing in the production line of emergency luminaire circuits.M. Dimopoulos, D. Papakostas, A. Spyronasios, A. Hatzopoulos, and D. Konstantinou. ICECS, page 778-781. IEEE, (2008)Closed-form expressions for the coupling capacitance of metal fill tiles in VLSI circuits.N. Tsatsoulis, Y. Bontzios, M. Dimopoulos, and A. Hatzopoulos. Microelectronics Journal, 44 (10): 953-958 (2013)Exact closed-form expressions for substrate resistance and capacitance extraction in nanoscale VLSI.Y. Bontzios, M. Dimopoulos, A. Dimitriadis, and A. Hatzopoulos. Microelectronics Journal, 44 (12): 1077-1083 (2013)