%0 Journal Article %1 journals/tim/BontziosDH11 %A Bontzios, Yiorgos I. %A Dimopoulos, Michael G. %A Hatzopoulos, Alkis A. %D 2011 %J IEEE Trans. Instrumentation and Measurement %K dblp %N 9 %P 3173-3184 %T A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI. %U http://dblp.uni-trier.de/db/journals/tim/tim60.html#BontziosDH11 %V 60

@article{journals/tim/BontziosDH11, added-at = {2016-03-09T00:00:00.000+0100}, author = {Bontzios, Yiorgos I. and Dimopoulos, Michael G. and Hatzopoulos, Alkis A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b4a702fc00ffbbb09a9fe88d09dd8fa2/dblp}, ee = {http://dx.doi.org/10.1109/TIM.2011.2124790}, interhash = {13ff6dc407c4b3a844aee9b18a000ab9}, intrahash = {b4a702fc00ffbbb09a9fe88d09dd8fa2}, journal = {IEEE Trans. Instrumentation and Measurement}, keywords = {dblp}, number = 9, pages = {3173-3184}, timestamp = {2016-03-10T11:42:10.000+0100}, title = {A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim60.html#BontziosDH11}, volume = 60, year = 2011 }