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Disambiguation of "Tsai, Kun-Han"

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Small delay testing for TSVs in 3-D ICs.

, , , , , , and . DAC, page 1031-1036. ACM, (2012)

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Liao Han University of Stuttgart

Qi Han

apl. Prof. Dr. -Ing. Niels Hansen University of Stuttgart

Replication Data for: Biocatalytic stereocontrolled head-to-tail cyclizations of unbiased terpenes as a tool in chemoenzymatic synthesis, and . Dataset, (2024)Related to: Schneider, Andreas; Lystbæk, Thomas B.; Markthaler, Daniel; Hansen, Niels; Hauer, Bernhard (2024): Biocatalytic stereocontrolled head-to-tail cyclizations of unbiased terpenes as a tool in chemoenzymatic synthesis. In: Nature Communications, 15, 4925. doi: 10.1038/s41467-024-48993-9.
Replication Data for: Biocatalytic stereocontrolled head-to-tail cyclizations of unbiased terpenes as a tool in chemoenzymatic synthesis, and . Dataset, (2024)Related to: Schneider, Andreas; Lystbæk, Thomas B.; Markthaler, Daniel; Hansen, Niels; Hauer, Bernhard (2024): Biocatalytic stereocontrolled head-to-tail cyclizations of unbiased terpenes as a tool in chemoenzymatic synthesis. In: Nature Communications, 15, 4925. doi: 10.1038/s41467-024-48993-9.Biocatalytic stereocontrolled head-to-tail cyclizations of unbiased terpenes as a tool in chemoenzymatic synthesis, , , , and . Nature Communications, 15 (1): 4925 (Jun 10, 2024)

Verena Kunberger University of Stuttgart

Koushani Kundu University of Stuttgart

 

Other publications of authors with the same name

Star test: the theory and its applications., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 19 (9): 1052-1064 (2000)Improved weight assignment for logic switching activity during at-speed test pattern generation., , , , , and . ASP-DAC, page 493-498. IEEE, (2010)Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology., , , and . ITC, page 1-10. IEEE Computer Society, (2006)A test-application-count based learning technique for test time reduction., , , and . VLSI-DAT, page 1-4. IEEE, (2015)Clock-domain-aware test for improving pattern compression., and . VLSI-DAT, page 1-4. IEEE, (2015)Programmable Leakage Test and Binning for TSVs., , , and . Asian Test Symposium, page 43-48. IEEE Computer Society, (2012)On-Line Transition-Time Monitoring for Die-to-Die Interconnects in 3D ICs., , , , and . ATS, page 162-167. IEEE Computer Society, (2014)Testability-Driven Fault Sampling for Deterministic Test Coverage Estimation of Large Designs.. ATS, page 119-124. IEEE Computer Society, (2014)Monitoring the delay of long interconnects via distributed TDC., , , and . ITC, page 1-9. IEEE, (2015)Scan-Encoded Test Pattern Generation for BIST., , and . ITC, page 548-556. IEEE Computer Society, (1997)