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Disambiguation of "Baeg, Sanghyeon"

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Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.

, , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (8-D): 1103-1107 (2013)

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Other publications of authors with the same name

Single Event Resilient Dynamic Logic Designs., , , , , , , , and . J. Electronic Testing, 30 (6): 751-761 (2014)Study of TID effects on one row hammering using gamma in DDR4 SDRAMs., , , and . IRPS, page 2-1. IEEE, (2018)Low-Power Ternary Content-Addressable Memory Design Using a Segmented Match Line.. IEEE Trans. on Circuits and Systems, 55-I (6): 1485-1494 (2008)A cost-effective design for testability: clock line control and test generation using selective clocking., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 18 (6): 850-861 (1999)Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress., , and . IEEE Trans. Instrumentation and Measurement, 61 (12): 3259-3272 (2012)Hybrid Partitioned SRAM-Based Ternary Content Addressable Memory., , and . IEEE Trans. on Circuits and Systems, 59-I (12): 2969-2979 (2012)Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals., , and . IEEE Trans. on Circuits and Systems, 57-I (4): 814-822 (2010)An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory., , , and . IEEE Trans. Computers, 63 (8): 2094-2098 (2014)Statistical distributions of row-hammering induced failures in DDR3 components., , and . Microelectronics Reliability, (2016)AC-JTAG: empowering JTAG beyond testing DC nets., and . ITC, page 30-37. IEEE Computer Society, (2001)