%0 Journal Article %1 journals/tcas/BaegWW10 %A Baeg, Sanghyeon %A Wen, Shi-Jie %A Wong, Richard %D 2010 %J IEEE Trans. on Circuits and Systems %K dblp %N 4 %P 814-822 %T Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals. %U http://dblp.uni-trier.de/db/journals/tcas/tcasI57.html#BaegWW10 %V 57-I

@article{journals/tcas/BaegWW10, added-at = {2011-10-19T00:00:00.000+0200}, author = {Baeg, Sanghyeon and Wen, Shi-Jie and Wong, Richard}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2771c215bc171becadcd4c8b373a57fa0/dblp}, ee = {http://dx.doi.org/10.1109/TCSI.2009.2025856}, interhash = {0fe622f26fdb22a48ccfe333685ac2b8}, intrahash = {771c215bc171becadcd4c8b373a57fa0}, journal = {IEEE Trans. on Circuits and Systems}, keywords = {dblp}, number = 4, pages = {814-822}, timestamp = {2016-02-02T02:21:35.000+0100}, title = {Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasI57.html#BaegWW10}, volume = {57-I}, year = 2010 }