%0 Journal Article %1 journals/et/WangLCLBWWFB14 %A Wang, Haibin %A Li, M.-L. %A Chen, Li %A Liu, Rui %A Baeg, Sanghyeon %A Wen, Shi-Jie %A Wong, Richard %A Fung, Rita %A Bi, J.-S. %D 2014 %J J. Electronic Testing %K dblp %N 6 %P 751-761 %T Single Event Resilient Dynamic Logic Designs. %U http://dblp.uni-trier.de/db/journals/et/et30.html#WangLCLBWWFB14 %V 30

@article{journals/et/WangLCLBWWFB14, added-at = {2016-11-16T00:00:00.000+0100}, author = {Wang, Haibin and Li, M.-L. and Chen, Li and Liu, Rui and Baeg, Sanghyeon and Wen, Shi-Jie and Wong, Richard and Fung, Rita and Bi, J.-S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/216833c7672f35f674c6a7ff305dca004/dblp}, ee = {http://dx.doi.org/10.1007/s10836-014-5492-2}, interhash = {6131942b2470ac9a3cab3ae6cb766efa}, intrahash = {16833c7672f35f674c6a7ff305dca004}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 6, pages = {751-761}, timestamp = {2016-11-17T10:32:42.000+0100}, title = {Single Event Resilient Dynamic Logic Designs.}, url = {http://dblp.uni-trier.de/db/journals/et/et30.html#WangLCLBWWFB14}, volume = 30, year = 2014 }