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Disambiguation of "Wong, Richard"

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Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication.

, , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (8-D): 1103-1107 (2013)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

King Cho Wong University of Stuttgart

Richard Völker University of Stuttgart

Univ. -Prof. Dr. Richard Dipper University of Stuttgart

Richard Powers University of Stuttgart

Richard Schömig University of Stuttgart

 

Other publications of authors with the same name

Minimizing Soft Errors in TCAM Devices: A Probabilistic Approach to Determining Scrubbing Intervals., , and . IEEE Trans. on Circuits and Systems, 57-I (4): 814-822 (2010)Variation of SRAM Alpha-Induced Soft Error Rate with Technology Node., , , , , and . IOLTS, page 253-257. IEEE Computer Society, (2008)Design and Analysis of Low-Voltage Low-Parasitic ESD Protection for RF ICs in CMOS., , , , , , , , , and 1 other author(s). J. Solid-State Circuits, 46 (5): 1100-1110 (2011)Performance, Metastability, and Soft-Error Robustness Trade-offs for Flip-Flops in 40 nm CMOS., , , , , , and . IEEE Trans. on Circuits and Systems, 59-I (8): 1626-1634 (2012)Networking industry trends in ESD protection for high speed IOs., , and . ASICON, page 1-4. IEEE, (2013)Soft error tolerant Content Addressable Memories (CAMs) using error detection codes and duplication., , , , and . Microprocessors and Microsystems - Embedded Hardware Design, 37 (8-D): 1103-1107 (2013)Mitigating the effects of large multiple cell upsets (MCUs) in memories., , , , and . ACM Trans. Design Autom. Electr. Syst., 16 (4): 45:1-45:10 (2011)Single-Event Effects Analysis of a Pulse Width Modulator IC in a DC/DC Converter., , , , , , , and . J. Electronic Testing, 28 (6): 877-883 (2012)A parallel sort-balance mutual range-join algorithm on hypercube computers., , and . Microprocessors and Microsystems - Embedded Hardware Design, 22 (3-4): 209-215 (1998)Correlation of Heavy-Ion and Laser Testing on a DC/DC PWM Controller., , , , , , , , and . J. Electronic Testing, 29 (4): 609-616 (2013)