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Failure analysis and solutions to overcome latchup failure event of a power controller IC in bulk CMOS technology., and . Microelectronics Reliability, 46 (7): 1042-1049 (2006)Quasi-3D method: Time-efficient TCAD and mixed-mode simulations on finFET technologies., , , , and . CICC, page 1-4. IEEE, (2013)Impact of local interconnects on ESD design., , , , and . ICICDT, page 1-4. IEEE, (2015)Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC., , , and . Microelectronics Reliability, (2016)Implementation of Initial-On ESD Protection Concept With PMOS-Triggered SCR Devices in Deep-Submicron CMOS Technology., and . J. Solid-State Circuits, 42 (5): 1158-1168 (2007)CDM-Time Domain Turn-on Transient of ESD Diodes in Bulk FinFET and GAA NW Technologies., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP., , , , , , , , , and 2 other author(s). IRPS, page 1-6. IEEE, (2019)Active-lite interposer for 2.5 & 3D integration., , , , , , , , , and 5 other author(s). VLSIC, page 222-. IEEE, (2015)Active ESD protection design against cross-power-domain ESD stresses in CMOS integrated circuits., and . APCCAS, page 57-60. IEEE, (2008)Transmission Rate Enhancement for Scalable H.264/AVC Video over MIMO Wireless Systems., , and . PCM, volume 5879 of Lecture Notes in Computer Science, page 55-64. Springer, (2009)