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ESD protection diodes in optical interposer technology., , , , , , and . ICICDT, page 1-4. IEEE, (2015)Processing active devices on Si interposer and impact on cost., , , , , , , , , and . 3DIC, page TS11.2.1-TS11.2.4. IEEE, (2015)ESD characterisation of a-IGZO TFTs on Si and foil substrates., , , , , , , , and . ESSDERC, page 276-279. IEEE, (2017)Impact of local interconnects on ESD design., , , , and . ICICDT, page 1-4. IEEE, (2015)A plug-and-play wideband RF circuit ESD protection methodology: T-diodes., , , , , , , , , and . Microelectronics Reliability, 49 (12): 1440-1446 (2009)Impact of on- and off-chip protection on the transient-induced latch-up sensitivity of CMOS IC., , , and . Microelectronics Reliability, (2016)Quasi-3D method: Time-efficient TCAD and mixed-mode simulations on finFET technologies., , , , and . CICC, page 1-4. IEEE, (2013)Inductor-based ESD protection under CDM-like ESD stress conditions for RF applications., , , , , , , and . CICC, page 49-52. IEEE, (2008)Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD Using TLP., , , , , , , , , and 2 other author(s). IRPS, page 1-6. IEEE, (2019)ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool?, , , , , , , and . IEEE Trans. Instrumentation and Measurement, 58 (10): 3418-3426 (2009)