Author of the publication

A 500 MHz Random Cycle, 1.5 ns Latency, SOI Embedded DRAM Macro Featuring a Three-Transistor Micro Sense Amplifier.

, , , , , , , , , , , , , , , , and . IEEE J. Solid State Circuits, 43 (1): 86-95 (2008)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Modular nets (MNETS): A modular design methodology for computer timers.. IBM Journal of Research and Development, 42 (6): 813-830 (1998)Fast Low Power eDRAM Hierarchical Differential Sense Amplifier., and . J. Solid-State Circuits, 44 (2): 631-641 (2009)Comparison of analytic performance models using closed mean-value analysis versus open-queuing theory for estimating cycles per instruction of memory hierarchies.. IBM Journal of Research and Development, 47 (4): 495-517 (2003)Analytical analysis of finite cache penalty and cycles per instruction of a multiprocessor memory hierarchy using miss rates and queuing theory., , and . IBM Journal of Research and Development, 45 (6): 819-842 (2001)Architecture, Design, and Operating Characteristics of a 12-ns CMOS Functional Cache Chip., , and . IBM Journal of Research and Development, 33 (5): 524-539 (1989)Impact of Memory Systems on Computer Architecture and System Organization.. IBM Systems Journal, 25 (3/4): 274-305 (1986)All Points Addressable Raster Display Memory., , , and . IBM Journal of Research and Development, 28 (4): 379-392 (1984)Logic-based eDRAM: Origins and rationale for use., and . IBM Journal of Research and Development, 49 (1): 145-166 (2005)Architecture Implications in the Design of Microprocessors., and . IBM Systems Journal, 23 (3): 264-280 (1984)A 500 MHz Random Cycle, 1.5 ns Latency, SOI Embedded DRAM Macro Featuring a Three-Transistor Micro Sense Amplifier., , , , , , , , , and 7 other author(s). IEEE J. Solid State Circuits, 43 (1): 86-95 (2008)