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On IEEE P1500's Standard for Embedded Core Test.

E. Marinissen, R. Kapur, M. Lousberg, T. McLaurin, M. Ricchetti, and Y. Zorian. J. Electronic Testing, 18 (4-5): 365-383 (2002)

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Erik Eppinger University of Stuttgart

Erik Hesselmeier University of Stuttgart

Tim Janz University of Stuttgart

PD Dr. phil. Frank Janle University of Stuttgart

Benedikt Janny

Other publications of authors with the same name

Test Access Mechanism Optimization, Test Scheduling, and Tester Data Volume Reduction for System-on-Chip.V. Iyengar, K. Chakrabarty, and E. Marinissen. IEEE Trans. Computers, 52 (12): 1619-1632 (2003)Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption.U. Ingelsson, S. Goel, E. Larsson, and E. Marinissen. IEEE Trans. Computers, 64 (12): 3335-3347 (2015)Murphy goes 3D.E. Marinissen. ISVLSI, page 102. IEEE Computer Socity, (2013)User-constrained test architecture design for modular SOC testing.L. Krundel, S. Goel, E. Marinissen, M. Flottes, and B. Rouzeyre. European Test Symposium, page 80-85. IEEE Computer Society, (2004)Guest Editors' Introduction: The Status of IEEE Std 1500 - Part 2.E. Marinissen, and Y. Zorian. IEEE Design & Test of Computers, 26 (3): 4 (2009)Wrapper design for embedded core test.Y. Zorian, E. Marinissen, M. Lousberg, and S. Goel. ITC, page 911-920. IEEE Computer Society, (2000)Efficient test access mechanism optimization for system-on-chip.V. Iyengar, K. Chakrabarty, and E. Marinissen. IEEE Trans. on CAD of Integrated Circuits and Systems, 22 (5): 635-643 (2003)Contactless testing: Possibility or pipe-dream?E. Marinissen, D. Lee, J. Hayes, C. Sellathamby, B. Moore, S. Slupsky, and L. Pujol. DATE, page 676-681. IEEE, (2009)Efficient Wrapper/TAM Co-Optimization for Large SOCs.V. Iyengar, K. Chakrabarty, and E. Marinissen. DATE, page 491-498. IEEE Computer Society, (2002)A structured and scalable test access architecture for TSV-based 3D stacked ICs.E. Marinissen, J. Verbree, and M. Konijnenburg. VTS, page 269-274. IEEE Computer Society, (2010)

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Disambiguation of "Marinissen, Erik Jan"

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On IEEE P1500's Standard for Embedded Core Test.

Please choose a person to relate this publication to

Erik Eppinger University of Stuttgart

Erik Hesselmeier University of Stuttgart

Tim Janz University of Stuttgart

PD Dr. phil. Frank Janle University of Stuttgart

Benedikt Janny

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Marinissen, Erik Jan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML On IEEE P1500's Standard for Embedded Core Test.

Please choose a person to relate this publication to

Erik Eppinger University of Stuttgart

Erik Hesselmeier University of Stuttgart

Tim Janz University of Stuttgart

PD Dr. phil. Frank Janle University of Stuttgart

Benedikt Janny

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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MSOffice XML

On IEEE P1500's Standard for Embedded Core Test.