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Disambiguation of "Sylvester, Dennis"

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Gate oxide leakage current analysis and reduction for VLSI circuits.

, , and . IEEE Trans. VLSI Syst., 12 (2): 155-166 (2004)

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Dennis Bauer University of Stuttgart

Dennis Przytarski University of Stuttgart

Dennis Weidner University of Stuttgart

Dennis Cerven University of Stuttgart

Dennis Hoppe

 

Other publications of authors with the same name

A New Threshold Voltage Assignment Scheme for Runtime Leakage Reduction in On-Chip Repeaters., , and . ICCD, page 138-143. IEEE Computer Society, (2004)Power-Driven Challenges in Nanometer Design., and . IEEE Design & Test of Computers, 18 (6): 12-22 (2001)iRazor: Current-Based Error Detection and Correction Scheme for PVT Variation in 40-nm ARM Cortex-R4 Processor., , , , , , , and . J. Solid-State Circuits, 53 (2): 619-631 (2018)A Constant Energy-Per-Cycle Ring Oscillator Over a Wide Frequency Range for Wireless Sensor Nodes., , and . J. Solid-State Circuits, 51 (3): 697-711 (2016)A 1920 × 1080 30-frames/s 2.3 TOPS/W Stereo-Depth Processor for Energy-Efficient Autonomous Navigation of Micro Aerial Vehicles., , , , , , , , , and . J. Solid-State Circuits, 53 (1): 76-90 (2018)Digitally Controlled Leakage-Based Oscillator and Fast Relocking MDLL for Ultra Low Power Sensor Platform., , , and . J. Solid-State Circuits, 50 (5): 1263-1274 (2015)Bubble Razor: Eliminating Timing Margins in an ARM Cortex-M3 Processor in 45 nm CMOS Using Architecturally Independent Error Detection and Correction., , , , , , and . J. Solid-State Circuits, 48 (1): 66-81 (2013)Crosstalk-Aware PWM-Based On-Chip Links With Self-Calibration in 65 nm CMOS., , and . J. Solid-State Circuits, 46 (9): 2041-2052 (2011)A Resonant Current-Mode Wireless Power Receiver and Battery Charger With -32 dBm Sensitivity for Implantable Systems., , , , , and . J. Solid-State Circuits, 51 (12): 2880-2892 (2016)Edge-Pursuit Comparator: An Energy-Scalable Oscillator Collapse-Based Comparator With Application in a 74.1 dB SNDR and 20 kS/s 15 b SAR ADC., , , , , , , , and . J. Solid-State Circuits, 52 (4): 1077-1090 (2017)