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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)

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WARM: Improving NAND flash memory lifetime with write-hotness aware retention management.Y. Luo, Y. Cai, S. Ghose, J. Choi, and O. Mutlu. MSST, page 1-14. IEEE Computer Society, (2015)Architectural Techniques for Improving NAND Flash Memory Reliability.Y. Luo. CoRR, (2018)Computational sprinting.A. Raghavan, Y. Luo, A. Chandawalla, M. Papaefthymiou, K. Pipe, T. Wenisch, and M. Martin. HPCA, page 249-260. IEEE Computer Society, (2012)Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.Y. Luo, S. Ghose, Y. Cai, E. Haratsch, and O. Mutlu. SIGMETRICS (Abstracts), page 106. ACM, (2018)Experimental Characterization, Optimization, and Recovery of Data Retention Errors in MLC NAND Flash Memory.Y. Cai, Y. Luo, E. Haratsch, K. Mai, S. Ghose, and O. Mutlu. CoRR, (2018)Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.Y. Cai, Y. Luo, E. Haratsch, K. Mai, and O. Mutlu. HPCA, page 551-563. IEEE Computer Society, (2015)Designing for Responsiveness with Computational Sprinting.A. Raghavan, Y. Luo, A. Chandawalla, M. Papaefthymiou, K. Pipe, T. Wenisch, and M. Martin. IEEE Micro, 33 (3): 8-15 (2013)Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)Enabling Accurate and Practical Online Flash Channel Modeling for Modern MLC NAND Flash Memory.Y. Luo, S. Ghose, Y. Cai, E. Haratsch, and O. Mutlu. IEEE Journal on Selected Areas in Communications, 34 (9): 2294-2311 (2016)Using ECC DRAM to Adaptively Increase Memory Capacity.Y. Luo, S. Ghose, T. Li, S. Govindan, B. Sharma, B. Kelly, A. Boroumand, and O. Mutlu. CoRR, (2017)

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Disambiguation of "Luo, Yixin"

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.