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Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.

Y. Luo, S. Ghose, Y. Cai, E. Haratsch, and O. Mutlu. POMACS, 2 (3): 37:1-37:48 (2018)

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WARM: Improving NAND flash memory lifetime with write-hotness aware retention management.Y. Luo, Y. Cai, S. Ghose, J. Choi, and O. Mutlu. MSST, page 1-14. IEEE Computer Society, (2015)Architectural Techniques for Improving NAND Flash Memory Reliability.Y. Luo. CoRR, (2018)Designing for Responsiveness with Computational Sprinting.A. Raghavan, Y. Luo, A. Chandawalla, M. Papaefthymiou, K. Pipe, T. Wenisch, and M. Martin. IEEE Micro, 33 (3): 8-15 (2013)Computational sprinting.A. Raghavan, Y. Luo, A. Chandawalla, M. Papaefthymiou, K. Pipe, T. Wenisch, and M. Martin. HPCA, page 249-260. IEEE Computer Society, (2012)Data retention in MLC NAND flash memory: Characterization, optimization, and recovery.Y. Cai, Y. Luo, E. Haratsch, K. Mai, and O. Mutlu. HPCA, page 551-563. IEEE Computer Society, (2015)Experimental Characterization, Optimization, and Recovery of Data Retention Errors in MLC NAND Flash Memory.Y. Cai, Y. Luo, E. Haratsch, K. Mai, S. Ghose, and O. Mutlu. CoRR, (2018)Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.Y. Luo, S. Ghose, Y. Cai, E. Haratsch, and O. Mutlu. SIGMETRICS (Abstracts), page 106. ACM, (2018)Read Disturb Errors in MLC NAND Flash Memory: Characterization, Mitigation, and Recovery.Y. Cai, Y. Luo, S. Ghose, and O. Mutlu. DSN, page 438-449. IEEE Computer Society, (2015)Bitmap approach to trend clustering for prediction in time series databases.J. Yoon, Y. Luo, and J. Nam. Data Mining and Knowledge Discovery: Theory, Tools, and Technology, volume 4384 of SPIE Proceedings, page 302-312. SPIE, (2001)Geometric Operator Convolutional Neural Network.Y. Ma, Y. Luo, and Z. Yang. CoRR, (2018)

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Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.

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Improving 3D NAND Flash Memory Lifetime by Tolerating Early Retention Loss and Process Variation.