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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)

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Kanuj Sharma University of Stuttgart

Other publications of authors with the same name

Effect of Channel Thickness and Doping Concentration on Sub-Threshold Performance of Graded Channel and Gate Stack DG MOSFETs.S. Swain, S. Adak, B. Sharma, S. Pati, and C. Sarkar. J. Low Power Electronics, 11 (3): 366-372 (2015)MDCSim: A multi-tier data center simulation, platform.S. Lim, B. Sharma, G. Nam, E. Kim, and C. Das. CLUSTER, page 1-9. IEEE Computer Society, (2009)MROrchestrator: A Fine-Grained Resource Orchestration Framework for MapReduce Clusters.B. Sharma, R. Prabhakar, S. Lim, M. Kandemir, and C. Das. IEEE CLOUD, page 1-8. IEEE, (2012)CloudPD: Problem determination and diagnosis in shared dynamic clouds.B. Sharma, P. Jayachandran, A. Verma, and C. Das. DSN, page 1-12. IEEE Computer Society, (2013)Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. DSN, page 467-478. IEEE Computer Society, (2014)Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance.Y. Luo, S. Govindan, B. Sharma, M. Santaniello, J. Meza, A. Kansal, J. Liu, B. Khessib, K. Vaid, and O. Mutlu. CoRR, (2016)Using ECC DRAM to Adaptively Increase Memory Capacity.Y. Luo, S. Ghose, T. Li, S. Govindan, B. Sharma, B. Kelly, A. Boroumand, and O. Mutlu. CoRR, (2017)Getting more performance with polymorphism from emerging memory technologies.I. Narayanan, A. Ganesan, A. Badam, S. Govindan, B. Sharma, and A. Sivasubramaniam. SYSTOR, page 8-20. ACM, (2019)SSD Failures in Datacenters: What? When? and Why?I. Narayanan, D. Wang, M. Jeon, B. Sharma, L. Caulfield, A. Sivasubramaniam, B. Cutler, J. Liu, B. Khessib, and K. Vaid. SYSTOR, page 7:1-7:11. ACM, (2016)Clock-like Flow Replacement Schemes for Resilient Flow Monitoring.G. Nam, P. Patankar, S. Lim, B. Sharma, G. Kesidis, and C. Das. ICDCS, page 129-136. IEEE Computer Society, (2009)

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Disambiguation of "Sharma, Bikash"

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

Please choose a person to relate this publication to

Kanuj Sharma University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Sharma, Bikash"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.

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Kanuj Sharma University of Stuttgart

Other publications of authors with the same name

Disambiguation

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Characterizing Application Memory Error Vulnerability to Optimize Datacenter Cost via Heterogeneous-Reliability Memory.