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Disambiguation of "Rodríguez, Rosana"

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Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.

, , , , , , , and . Microelectronics Reliability, 47 (9-11): 1349-1352 (2007)

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Ana Rodriguez Quiroga University of Stuttgart

Rocio Belen Rodriguez University of Stuttgart

 

Other publications of authors with the same name

Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films., , , and . Microelectronics Reliability, 41 (7): 1011-1013 (2001)Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs., , , , , , and . Microelectronics Reliability, 52 (9-10): 1924-1927 (2012)Effect of oxide breakdown on RS latches., , , and . Microelectronics Reliability, 47 (4-5): 581-584 (2007)Influence of the SiO2 layer thickness on the degradation of HfO2/SiO2 stacks subjected to static and dynamic stress conditions., , , , and . Microelectronics Reliability, 47 (4-5): 544-547 (2007)SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors., , , , , , , and . Microelectronics Reliability, 50 (9-11): 1263-1266 (2010)CASE: A reliability simulation tool for analog ICs., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Automated Massive RTN Characterization Using a Transistor Array Chip., , , , , , , , and . SMACD, page 29-32. IEEE, (2018)A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation., , , , , , , , and . SMACD, page 53-56. IEEE, (2018)Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization., , , , and . DCIS, page 1-4. IEEE, (2018)