%0 Journal Article %1 journals/mr/RodriguezPNA01 %A Rodríguez, Rosana %A Porti, Marc %A Nafría, Montserrat %A Aymerich, Xavier %D 2001 %J Microelectronics Reliability %K dblp %N 7 %P 1011-1013 %T Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#RodriguezPNA01 %V 41

@article{journals/mr/RodriguezPNA01, added-at = {2015-02-05T00:00:00.000+0100}, author = {Rodríguez, Rosana and Porti, Marc and Nafría, Montserrat and Aymerich, Xavier}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/271866a968537af6b28b82a49cfccf456/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00059-2}, interhash = {a0c673ac625fb35a690b8cc12b18c736}, intrahash = {71866a968537af6b28b82a49cfccf456}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {1011-1013}, timestamp = {2016-02-02T02:02:03.000+0100}, title = {Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#RodriguezPNA01}, volume = 41, year = 2001 }