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Moments of the Inverse Scattering Operator of the Boltzmann Equation: Theory and Applications., , and . SIAM Journal of Applied Mathematics, 66 (4): 1209-1226 (2006)Characterization of photonic devices by secondary electron potential contrast., , and . Microelectronics Reliability, 46 (9-11): 1536-1541 (2006)Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles., , , , and . Microelectronics Reliability, 45 (9-11): 1694-1699 (2005)A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters., , , , and . Microelectronics Reliability, 50 (9-11): 1750-1757 (2010)On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices., , , , and . Microelectronics Reliability, 43 (9-11): 1771-1776 (2003)On the Use of Neural Networks to Solve the Reverse Modelling Problem for the Quantification of Dopant Profiles Extracted by Scanning Probe Microscopy Techniques., , , , and . Microelectronics Reliability, 44 (9-11): 1703-1708 (2004)Proof of a simple time-step propagation scheme for Monte Carlo simulation., , and . Mathematics and Computers in Simulation, 62 (3-6): 323-326 (2003)Mixed element trees: a generalization of modified octrees for the generation of meshes for the simulation of complex 3-D semiconductor device structures., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 12 (11): 1714-1725 (1993)A new discretization scheme for the semiconductor current continuity equations., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 8 (5): 479-489 (1989)Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor., , , , , and . ITC, page 414-420. IEEE Computer Society, (1999)