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Disambiguation of "Fichtner, Wolfgang"

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Characterization of photonic devices by secondary electron potential contrast.

, , and . Microelectronics Reliability, 46 (9-11): 1536-1541 (2006)

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Mirko Fichtner University of Stuttgart

Univ. -Prof. Dr. -Ing. Wolfgang Rheinheimer University of Stuttgart

Univ. -Prof. Dr. Wolfgang Kühnel University of Stuttgart

apl. Prof. Dr. Wolfgang Hauber University of Stuttgart

apl. Prof. Dr. Wolfgang Bolse University of Stuttgart

 

Other publications of authors with the same name

Hardware evaluation of the stream cipher-based hash functions RadioGatún and irRUPT., , , and . DATE, page 646-651. IEEE, (2009)A 0.25 μm 0.92 mW per Mb/s Viterbi decoder featuring resonant clocking for ultra-low-power 54 Mb/s WLAN communication., , , , , , , and . CICC, page 451-454. IEEE, (2007)Gram-Schmidt-based QR decomposition for MIMO detection: VLSI implementation and comparison., , , , , , and . APCCAS, page 830-833. IEEE, (2008)Moments of the Inverse Scattering Operator of the Boltzmann Equation: Theory and Applications., , and . SIAM Journal of Applied Mathematics, 66 (4): 1209-1226 (2006)Functional verification of intellectual properties (IP): a simulation-based solution for an application-specific instruction-set processor., , , , , and . ITC, page 414-420. IEEE Computer Society, (1999)A new discretization scheme for the semiconductor current continuity equations., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 8 (5): 479-489 (1989)Mixed element trees: a generalization of modified octrees for the generation of meshes for the simulation of complex 3-D semiconductor device structures., , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 12 (11): 1714-1725 (1993)Characterization of photonic devices by secondary electron potential contrast., , and . Microelectronics Reliability, 46 (9-11): 1536-1541 (2006)Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles., , , , and . Microelectronics Reliability, 45 (9-11): 1694-1699 (2005)A new built-in screening methodology for Successive Approximation Register Analog to Digital Converters., , , , and . Microelectronics Reliability, 50 (9-11): 1750-1757 (2010)