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Disambiguation of "Munoz-Baron, K."

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Online Junction Temperature Sensing Using the Voltage Drop Over the Parasitic Source Inductance

, , , and . in Proc. PCIM Europe Conference, (2024)

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Kevin Muñoz Barón

Kevin Muñoz Barón

Kevin Munoz Baron University of Stuttgart

Marvin Munoz Barón University of Stuttgart

Kevin Muñoz Barón

 

Other publications of authors with the same name

Application-Oriented Characterozation of Thermally-Optimized Asymmetricl Single Chip Packages for 100 V GaN HEMTs, , , , , and . in Proc. International Symposium on Power Semiconductor Devices and ICs (ISPSD), (2023)A Fast Source to Drain Voltage Measurement in Bridge Topologies Using a Freewheeling Path for Dynamic Power Cycling Tests, , and . in Proc. International Conference on Integrated Power Electronics Systems (CIPS), Duesseldorf, (2024)Static and Dynamic Characterization of a Monolithic Integrated Temperature Sensor in a 600 V GaN Power IC, , , , , , and . in. Proc. PCIM Europe, Nuremberg, Germany, (May 2020)Static and Dynamic Characterization of a Monolithic Integrated Temperature Sensor in a 600 V GaN Power IC, , , , , and . in. Proc. PCIM Europe, Nuremberg, Germany, (May 2020)Comprehensive Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Online Condition Monitoring of Power Modules, and . in Proc. Applied Power Electronics Conferrence (APEC), Orlando, (March 2023)Application-Oriented Active Power Cycling of SiC MOSFET Power Modules with Multiple TSEP Acquisition, , , and . in Proc. 47th Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe and 18th Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (WOCSDICE-EXMATEC 2024), (2024)failure analysis of SiC power transistor via time domain reflectometry, , , and . in Proc. CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME, Naples, (July 2022)Virtual Junction Temperature Estimation during Dynamic Power Cycling Tests, and . in Proc. 11th International Conference on Power Electronics (ICPE 2023-ECCE Asia), Korea, (May 2023)A Robust Approach for Characterization of Junction Temperature of SiC power devices via Quasi-Threshold Voltage as Temperature Sensitive Electrical Parameter, , , , , , and . in Proc. Applied Power Electronics Conf. (APEC), New Orleans, (March 2020)PCB-Integrated Pickup-Coil for Overcurrent Detection in High-Current, Paralleled GaN HEMTs, , , , and . in Proc. Applied Power Electronics Conference (APEC), Long Beach, (February 2024)