failure analysis of SiC power transistor via time domain reflectometry
K. Sharma, S. Kamm, K. Munoz-Baron, and I. Kallfass. in Proc. CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME, Naples, (July 2022)
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%0 Journal Article
%1 Sharma_CIRP2022
%A Sharma, K.
%A Kamm, S.
%A Munoz-Baron, K.
%A Kallfass, I.
%D 2022
%J in Proc. CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME, Naples
%K imported
%T failure analysis of SiC power transistor via time domain reflectometry
@article{Sharma_CIRP2022,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Sharma, K. and Kamm, S. and Munoz-Baron, K. and Kallfass, I.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2baf2cac11aa8e6b5746b16ddd9206430/ingmarkallfass},
date-added = {2021-06-16 18:53:05 +0200},
date-modified = {2025-05-24 12:04:18 +0200},
interhash = {9a0c7ed9920125f9c82cf8a3584a0c7d},
intrahash = {baf2cac11aa8e6b5746b16ddd9206430},
journal = {in Proc. CIRP Conference on Intelligent Computation in Manufacturing Engineering - CIRP ICME, Naples},
keywords = {imported},
month = {Jul.},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {{failure analysis of SiC power transistor via time domain reflectometry}},
year = 2022
}
