Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.

J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K. Mackay. Asian Test Symposium, page 125-130. IEEE Computer Society, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Jeremy Nuzzo University of Stuttgart

Martin Alvarez University of Stuttgart

Manuel Alvarez Chaves University of Stuttgart

Other publications of authors with the same name

Impact of resistive-open defects on the heat current of TAS-MRAM architectures.J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri-Sanial, G. Prenat, J. Alvarez-Herault, and K. Mackay. DATE, page 532-537. IEEE, (2012)Coupling-based resistive-open defects in TAS-MRAM architectures.J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K. Mackay. European Test Symposium, page 1. IEEE Computer Society, (2012)Scalability and logic functionalities of TA-MRAMs.I. Prejbeanu, R. Sousa, B. Dieny, J. Nozieres, S. Bandiera, J. Alvarez-Herault, Q. Stainer, L. Lombard, C. Ducruet, Y. Conraux and 1 other author(s). NEWCAS, page 1-4. IEEE, (2013)A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri-Sanial, J. Alvarez-Herault, and K. Mackay. IEEE Trans. VLSI Syst., 22 (11): 2326-2335 (2014)Automated characterization of TAS-MRAM test arrays.A. Grossi, C. Zambelli, P. Olivo, P. Pellati, M. Ramponi, J. Alvarez-Herault, and K. Mackay. DTIS, page 1-2. IEEE, (2015)Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.J. Azevedo, A. Virazel, A. Bosio, L. Dilillo, P. Girard, A. Todri, G. Prenat, J. Alvarez-Herault, and K. Mackay. Asian Test Symposium, page 125-130. IEEE Computer Society, (2012)Reliability and cell-to-cell variability of TAS-MRAM arrays under cycling conditions.A. Grossi, C. Zambelli, P. Olivo, J. Alvarez-Herault, and K. Mackay. NVMTS, page 1-4. IEEE, (2015)

PUMA

Disambiguation of "Alvarez-Herault, Jérémy"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.

Please choose a person to relate this publication to

Jeremy Nuzzo University of Stuttgart

Martin Alvarez University of Stuttgart

Manuel Alvarez Chaves University of Stuttgart

Other publications of authors with the same name

Disambiguation

PUMA

Disambiguation of "Alvarez-Herault, Jérémy"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.

Please choose a person to relate this publication to

Jeremy Nuzzo University of Stuttgart

Martin Alvarez University of Stuttgart

Manuel Alvarez Chaves University of Stuttgart

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Impact of Resistive-Bridge Defects in TAS-MRAM Architectures.