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Disambiguation of "Kwark, Young Hoon"

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SiGe BiCMOS integrated circuits for high-speed serial communication links.

, , , , , , , , , , , and . IBM Journal of Research and Development, 47 (2-3): 259-282 (2003)

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Moon Young Jeong University of Stuttgart

 

Other publications of authors with the same name

A 1.4-pJ/b, power-scalable 16×12-Gb/s source-synchronous I/O with DFE receiver in 32nm SOI CMOS technology., , , , , , , , , and 6 other author(s). CICC, page 1-4. IEEE, (2014)A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology., , , , , , , , , and 7 other author(s). J. Solid-State Circuits, 50 (8): 1917-1931 (2015)Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection., , , , , , , , , and 10 other author(s). IBM Journal of Research and Development, 49 (4-5): 725-754 (2005)Wide band home phone line characterization., , , and . IEEE Trans. Consumer Electronics, 46 (1): 76-86 (2000)SiGe BiCMOS integrated circuits for high-speed serial communication links., , , , , , , , , and 2 other author(s). IBM Journal of Research and Development, 47 (2-3): 259-282 (2003)Wide band AC power line characterization., , , and . IEEE Trans. Consumer Electronics, 45 (4): 1087-1097 (1999)Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures., , , , , and . IEEE Trans. Instrumentation and Measurement, 61 (12): 3198-3206 (2012)Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects., , , , and . DATE, page 252-255. ACM, (2008)