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Replication Data for: 'Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature' : Raw .tab data sets for Nat. Commun. 16, 4669 (2025)

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Dataset, (2025)Related to: Timo Steidl, Pierre Kuna, Erik Hesselmeier-Hüttmann, Di Liu, Rainer Stöhr, Wolfgang Knolle, Misagh Ghezellou, Jawad Ul-Hassan, Maximilian Schober, Michel Bockstedte, Guodong Bian, Adam Gali, Vadim Vorobyov and Jörg Wrachtrup, "Single V2 defect in 4H Silicon Carbide Schottky diode at low temperature" (2024). arXiv: 2410.09021.
DOI: 10.18419/darus-4810

Zusammenfassung

Tabular style data sets to reproduce all plots in the paper. The datasets are either 1D plots with the x-values in the first column and all plotted y-curves in the following columns or pairwise if stated such. For 2D plots, the data consists of a vector containing the values of the x- and y-axis (first row and column, respectively) as well as the 2D data.

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