Integrated Use of Reliability-Relevant Information and Knowledge in Product Development of Mechatronics
D. Hofmann, M. Kopp, und B. Bertsche. 16th ISSAT International Conference on Reliability and Quality in Design, Seite 163-168. Piscataway, NJ, Internat. Soc. of Science and Applied Technologies, (2010)
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%0 Conference Paper
%1 hofmann2010integrated
%A Hofmann, Daniel
%A Kopp, Michael
%A Bertsche, Bernd
%B 16th ISSAT International Conference on Reliability and Quality in Design
%C Piscataway, NJ
%D 2010
%E Pham, Hoang
%I Internat. Soc. of Science and Applied Technologies
%K
%P 163-168
%T Integrated Use of Reliability-Relevant Information and Knowledge in Product Development of Mechatronics
%@ 978-0-9763486-6-5
@inproceedings{hofmann2010integrated,
added-at = {2023-08-31T16:42:56.000+0200},
address = {Piscataway, NJ},
author = {Hofmann, Daniel and Kopp, Michael and Bertsche, Bernd},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/237c366afb2dc52cf82f7dfd223c032e8/puma-wartung},
booktitle = {16th ISSAT International Conference on Reliability and Quality in Design},
editor = {Pham, Hoang},
eventdate = {2010-08-05/2010-08-07},
eventtitle = {16th ISSAT International Conference on Reliability and Quality in Design},
interhash = {fef4bef1a673be2ee49012721b9281fa},
intrahash = {37c366afb2dc52cf82f7dfd223c032e8},
isbn = {978-0-9763486-6-5},
keywords = {},
language = {eng},
pages = {163-168},
publisher = {Internat. Soc. of Science and Applied Technologies},
timestamp = {2023-08-31T14:42:56.000+0200},
title = {Integrated Use of Reliability-Relevant Information and Knowledge in Product Development of Mechatronics},
venue = {Washington, DC},
year = 2010
}
