%0 Conference Paper %1 liu2017aging %A Liu, Chang %A Kochte, Michael A. %A Wunderlich, Hans-Joachim %B 2017 IEEE 35th VLSI Test Symposium (VTS) %C Piscataway %D 2017 %I IEEE %K %R 10.1109/VTS.2017.7928921 %T Aging monitor reuse for small delay fault testing %@ 978-1-4673-8454-4 and 978-1-4673-8453-7

@inproceedings{liu2017aging, added-at = {2023-08-31T16:36:03.000+0200}, address = {Piscataway}, author = {Liu, Chang and Kochte, Michael A. and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f8d388552a64272540c9d02118da5147/puma-wartung}, booktitle = {2017 IEEE 35th VLSI Test Symposium (VTS)}, doi = {10.1109/VTS.2017.7928921}, eventdate = {2017-04-09/2017-04-12}, eventtitle = {2017 IEEE 35th VLSI Test Symposium (VTS)}, interhash = {ea1218bd729e2dc3b5105b95f3336fbb}, intrahash = {f8d388552a64272540c9d02118da5147}, isbn = {{978-1-4673-8454-4} and {978-1-4673-8453-7}}, keywords = {}, language = {eng}, publisher = {IEEE}, timestamp = {2023-08-31T14:36:03.000+0200}, title = {Aging monitor reuse for small delay fault testing}, venue = {Las Vegas, NV, USA}, year = 2017 }