%0 Journal Article %1 journals/mr/HaggagLMM05 %A Haggag, A. %A Liu, N. %A Menke, D. %A Moosa, M. %D 2005 %J Microelectronics Reliability %K dblp %N 12 %P 1855-1860 %T Physical model for the power-law voltage and current acceleration of TDDB. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#HaggagLMM05 %V 45

@article{journals/mr/HaggagLMM05, added-at = {2007-03-27T00:00:00.000+0200}, author = {Haggag, A. and Liu, N. and Menke, D. and Moosa, M.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2dbc9575ca541653b868c9c23b3912173/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2005.03.011}, interhash = {d5cb98d28ad8f15367bca37d68dfb5e6}, intrahash = {dbc9575ca541653b868c9c23b3912173}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 12, pages = {1855-1860}, timestamp = {2016-02-02T02:01:59.000+0100}, title = {Physical model for the power-law voltage and current acceleration of TDDB.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#HaggagLMM05}, volume = 45, year = 2005 }