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%0 Journal Article
%1 journals/mr/HaggagLMM05
%A Haggag, A.
%A Liu, N.
%A Menke, D.
%A Moosa, M.
%D 2005
%J Microelectronics Reliability
%K dblp
%N 12
%P 1855-1860
%T Physical model for the power-law voltage and current acceleration of TDDB.
%U http://dblp.uni-trier.de/db/journals/mr/mr45.html#HaggagLMM05
%V 45
@article{journals/mr/HaggagLMM05,
added-at = {2007-03-27T00:00:00.000+0200},
author = {Haggag, A. and Liu, N. and Menke, D. and Moosa, M.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2dbc9575ca541653b868c9c23b3912173/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2005.03.011},
interhash = {d5cb98d28ad8f15367bca37d68dfb5e6},
intrahash = {dbc9575ca541653b868c9c23b3912173},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 12,
pages = {1855-1860},
timestamp = {2016-02-02T02:01:59.000+0100},
title = {Physical model for the power-law voltage and current acceleration of TDDB.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#HaggagLMM05},
volume = 45,
year = 2005
}