%0 Journal Article %1 journals/mr/TangCBWDLTKBTW14 %A Tang, Baojun %A Croes, Kris %A Barbarin, Y. %A Wang, Y. Q. %A Degraeve, Robin %A Li, Y. %A Toledano-Luque, Maria %A Kauerauf, Thomas %A Bömmels, Jürgen %A Tokei, Zsolt %A Wolf, Ingrid De %D 2014 %J Microelectronics Reliability %K dblp %N 9-10 %P 1675-1679 %T As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#TangCBWDLTKBTW14 %V 54

@article{journals/mr/TangCBWDLTKBTW14, added-at = {2016-05-19T00:00:00.000+0200}, author = {Tang, Baojun and Croes, Kris and Barbarin, Y. and Wang, Y. Q. and Degraeve, Robin and Li, Y. and Toledano-Luque, Maria and Kauerauf, Thomas and Bömmels, Jürgen and Tokei, Zsolt and Wolf, Ingrid De}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/222b4879fc2e6d0920ccf6b7385142a8d/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2014.07.089}, interhash = {8eb7076e26d62e74c2394ffb751a1293}, intrahash = {22b4879fc2e6d0920ccf6b7385142a8d}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1675-1679}, timestamp = {2016-05-20T09:32:01.000+0200}, title = {As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#TangCBWDLTKBTW14}, volume = 54, year = 2014 }