%0 Conference Paper %1 conf/itc/DattaGSAd04 %A Datta, Ramyanshu %A Gupta, Ravi %A Sebastine, Antony %A Abraham, Jacob A. %A d'Abreu, Manuel A. %B ITC %D 2004 %I IEEE Computer Society %K dblp %P 1118-1127 %T Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#DattaGSAd04 %@ 0-7803-8581-0

@inproceedings{conf/itc/DattaGSAd04, added-at = {2006-09-21T00:00:00.000+0200}, author = {Datta, Ramyanshu and Gupta, Ravi and Sebastine, Antony and Abraham, Jacob A. and d'Abreu, Manuel A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25910191498add4c65518ae013c048d71/dblp}, booktitle = {ITC}, crossref = {conf/itc/2004}, ee = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.197}, interhash = {24ef4dbdedfdb1671c12986bfff1f356}, intrahash = {5910191498add4c65518ae013c048d71}, isbn = {0-7803-8581-0}, keywords = {dblp}, pages = {1118-1127}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:32:30.000+0100}, title = {Tri-Scan: A Novel DFT Technique for CMOS Path Delay Fault Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#DattaGSAd04}, year = 2004 }