%0 Conference Paper %1 kamm2021hybrid %A Kamm, Simon %A Sharma, Kanuj %A Kallfass, Ingmar %A Jazdi, Nasser %A Weyrich, Michael %B 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) %D 2021 %I IEEE %K mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos %R 10.1109/IPFA53173.2021.9617401 %T Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data %@ 978-1-6654-3988-6 and 978-1-6654-3989-3

@inproceedings{kamm2021hybrid, added-at = {2023-02-01T15:46:01.000+0100}, affiliation = {Kamm, S (Corresponding Author), Univ Stuttgart, Inst Ind Automat & Software Engn, Pfaffenwaldring 47, Stuttgart, Germany. Kamm, Simon; Jazdi, Nasser; Weyrich, Michael, Univ Stuttgart, Inst Ind Automat & Software Engn, Pfaffenwaldring 47, Stuttgart, Germany. Sharma, Kanuj; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Pfaffenwaldring 47, Stuttgart, Germany.}, author = {Kamm, Simon and Sharma, Kanuj and Kallfass, Ingmar and Jazdi, Nasser and Weyrich, Michael}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8616ead4735f2423ad2f17d43d8e17e/unibiblio}, booktitle = {2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)}, doi = {10.1109/IPFA53173.2021.9617401}, eventdate = {2021-09-14/2021-10-13}, eventtitle = {IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)}, interhash = {1102c2ece36dac2e6c30ba69199f858b}, intrahash = {b8616ead4735f2423ad2f17d43d8e17e}, isbn = {{978-1-6654-3988-6} and {978-1-6654-3989-3}}, keywords = {mult ubs_10005 ubs_20007 ubs_30076 ubs_30175 ubs_40346 ubs_40357 unibibliografie wos}, language = {eng}, publisher = {IEEE}, timestamp = {2023-02-01T14:46:01.000+0100}, title = {Hybrid Modelling for the Failure Analysis of SiC Power Transistors on Time-Domain Reflectometry Data}, unique-id = {WOS:000782378200072}, venue = {Online}, year = 2021 }